3600E
3600E Dual Head System: Bipolar/FET/Diode
The model 3600E test system is an automated system designed for testing 2, 3 and 4- lead discrete semiconductors such as: Bipolar Transistors, Single and Dual-gate FETs, Sense FETs, PUTs, TRIACs, SCRs, Diodes, Zeners and Optos.Standard Hardware Capabilities
- Two Test Stations
- 600V/120A, 1200V/120A and 1650V/120A · 1 Pico-ampere Leakage Measurements
- Auto-zeroed Current Measurement Circuitry
- 16 bit DACs on V/I supplies for both current and voltage compliance
- 1 KHz AC synchronous phase detection
- 16 bit 4 ½ digit DVM
- 24 bin opto-isolated handler/prober interface
- Multi-user Pentium class computer
Lead Switching & Capacitance Testing
IF3S option allows lead switching and the performance of device capacitance measurements at 1MHz.