36XX

Bipolar/FET/Diode Dual Head Production Test System

3600E: Dual Test Head System for 2, 3, 4+ Lead Devices
3601E: Dual Test Head System optimized for 2 Lead Devices
3602E: Dual 3600E Systems in One Rack
3603E: Dual 3601E Systems in One Rack

FEATURES:

Two test stations on the 3600E and 3601E systems
Performs DC, AC, and pulsed tests
Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons
24 bin opto-isolated handler/prober interface
Parallel first-in first out computer to tester interface for maximum throughput
Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites
Multi-user Pentium class computer with monitor and keyboard. Printers and additional serial consoles are optional