34XX

Bipolar/FET/Diode Single Head Test System

3400E: Single Test Head System for 2, 3, 4+ Lead Devices
3401E: Single Test Head System optimized for 2 Lead Devices
3402E: Dual 3400 Systems in One Rack
3403E: Dual 3401 Systems in One Rack

FEATURES:

Performs DC, AC, and pulsed tests
Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors
24 bin opto-isolated handler/prober interface
Parallel first-in first out computer to tester interface for maximum throughput
Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites
Multi-user Pentium class computer with monitor and keyboard. Printers and additional serial consoles are optional
Test capabilities can be expanded with various remote station and interface options