36XX Series More Info

Bipolar/FET/Diode Dual Head Production Test System

3600E: Dual Test Head System for 2, 3, 4+ Lead Devices
3601E: Dual Test Head System optimized for 2 Lead Devices
3602E: Dual 3600E Systems in One Rack
3603E: Dual 3601E Systems in One Rack

FEATURES:

Two test stations on the 3600E and 3601E systems
Performs DC, AC, and pulsed tests
Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors
24 bin opto-isolated handler/prober interface
Parallel first-in first out computer to tester interface for maximum throughput
Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites
Multi-user Pentium class computer with monitor and keyboard. Printers and additional serial consoles are optional

3600E Designed for the production floor environment, the Model 3600E is a highly sophisticated instrument used for testing of today’s discrete semiconductor devices. Incorporating a dual multiplexed test station design, including control for two device handlers or probers, the Model 3600E provides the high throughput solution for today’s production environments.

Employing state-of-the-art hardware and software, the Model 3600E features an advanced, high-speed tester processor that results in the highest device throughput available in its class. Higher speed combined with higher forcing voltage, higher forcing current, and higher accuracy gives the Model 3600E unmatched performance and flexibility. Menu driven software and a report generator provide an easy to use programming and operating environment.

Configured to meet Your Needs
Available in three high-voltage configurations, the Model 3600E can perform breakdown measurements to potentials of 1650 volts and sense leakage currents to 1 pico-ampere levels. Pulsed “ON” currents as high as 120 amps can be forced and measured. Low duty-cycle pulse measurement tests limit device heating during high-current testing.

The Model 3600E employs 16 bit D/A converters in the forcing supplies and utilizes a 4 1/2 digit DVM. Optional capacitance testing is available. The Model 3600E is available as a bench top or freestanding rack cabinet system.

Model 3602E comprises two complete testers in a single cabinet with both testers operating from a single Pentium class computer. This system is best utilized when interfaced with two high speed multiple test site handlers enabling the user to perform true parallel testing or 100% in line QA testing.

Lower Cost Diode Systems Available
We offer the Model 3601E, a two-leaded version of the Model 3600E. The Model 3601E can perform all the standard two lead test parameters, plus the added capability of testing unique parameters related to SSOVPs and SIDACs.

Flexible Handler Interfacing
Digital control of handlers and probers is accomplished with an opto-isolated interface that can be configured to the user’s requirements. True Analog Measurements and Forcing Functions A unique feature of the 3600E Test System is that all measurements are made in an analog fashion so that the “true” value (rather than a go/no-go value) is established. Multiple limits can be established for any test. Tests are never repeated. Data may be saved with no loss in device throughput.

The forcing V/I supplies are programmed for both voltage and current compliance by 16 bit D-to-A converters. The current measurement circuitry is auto-zeroed before each current measurement.

Using its 1KHz synchronous phase detection capability, the Model 3600E Test System is able to distinguish the sought-after small signal AC signal from spurious signals generated by stray capacitance and noise. This provides highly accurate AC measurements necessary for difficult parameters such as transconductance and output conductance of small signal FETs.

For Zener Diodes and Current Limiters
The Model 3600E offers the precision and accuracy essential for measuring zener voltage, zener impedance, and current limiter output impedance. Settling times can be established in one-millisecond increments up to 60 seconds. Pulsed tests are programmable in 100 microsecond increments to 10 milliseconds. Thus, variable “soak times” for any or all tests are easily programmed.

Best Yield Analysis
The Model 3600 Test System includes best yield analysis software as a standard feature. The program accommodates the practice of running wafers or final test lots that lend themselves to several part numbers, selecting the sort priority that will produce the highest yield in the minimal amount of test time.

Full Math Operator Function
A math operator function allows the user to pass direct or modified results from one test to a second test as a forcing condition, or to modify limits of a test based upon the results from a previous test. Users may also perform on-line rations, averages, differences, percentages, and apply exponents to the resultant calculation as in device figure of merit determinations.

Powerful Software
The Hi-Rel software package provides complete analysis and reporting capability for delta and delta/percent testing, including on-line delta testing with immediate operator feedback and retest mode. The Statistical Analysis software provides summary information and min/max values, mean, CPK, standard deviation, skew, kurtosis and normalcy. Percentiles, histograms and scatter plots are also included. Full color wafer mapping and digital curve tracing is available in the optional FET/Graph software package.

Expandability
The capabilities of the Model 3600E Test System can be expanded with a variety of optional I/F Boxes that can be interfaced with your prober or handler. These I/F Boxes can add such capabilities as software controlled DUT lead configuring; capacitance and/or dual device testing that cannot be performed at the main test station. See the IFXX interface pages for details. Rigorously Tested The warranty covers every component in the system for one year.